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Synchrotron x-ray topography studies of twin structures in lanthanum aluminate single crystals

Published online by Cambridge University Press:  31 January 2011

Gong-Da Yao ,
Shang Yun Hou ,
Michael Dudley  and
Julia M. Phillips
Gong-Da Yao
Affiliation:
Department of Materials Science and Engineering, State University of New York at Stony Brook, Stony Brook, New York 11794-2275
Shang Yun Hou
Affiliation:
Department of Materials Science and Engineering, State University of New York at Stony Brook, Stony Brook, New York 11794-2275
Michael Dudley
Affiliation:
Department of Materials Science and Engineering, State University of New York at Stony Brook, Stony Brook, New York 11794-2275
Julia M. Phillips
Affiliation:
AT&T Bell Laboratories, Murray Hill, New Jersey 07974
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Abstract

An extensive investigation of twin structures in lanthanum aluminate single crystals at room temperature has been undertaken using White Beam Synchrotron X-Ray Topography (WBSXRT). Twin configurations, directly observable via orientation contrast, were found to comprise both large-volume, macroscopic twins and thick twin lamellae. Positional shifts of twin domain images with respect to matrix images, arising from the mutual misorientation of diffraction vectors, were measured on x-ray topographic images recorded from the (220)rhom planes approximately parallel to the specimen surface and compared to calculated values in order to solve the twin laws in this system. The dominant twin operations were found to be (101)rhom, (011)rhom, and (112)rhom mirror reflections. The potential influence of the twins on the growth of epitaxial Ba2YCu3O7−δ thin films is discussed.

Type
Articles
Information
Journal of Materials Research , Volume 7 , Issue 7 , July 1992 , pp. 1847 - 1855
Copyright
Copyright © Materials Research Society 1992

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