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Fast Grain Mapping with Sub-Nanometer Resolution Using 4D-STEM with Grain Classification by Principal Component Analysis and Non-Negative Matrix Factorization
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- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue 4 / August 2021
- Published online by Cambridge University Press:
- 25 June 2021, pp. 794-803
- Print publication:
- August 2021
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High Throughput Grain Mapping with Sub-Nanometer Resolution by 4D-STEM
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 1960-1961
- Print publication:
- August 2019
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Detailed Investigation of Silicon Nitride Phase Plates Prepared by Focused Ion Beam Milling
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 900-901
- Print publication:
- August 2019
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