7 results
Semi-Automated, Object-Based Tomography of Dislocation Structures
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue 3 / June 2022
- Published online by Cambridge University Press:
- 08 March 2022, pp. 633-645
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- June 2022
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A Method for Plan-View FIB Liftout of Near Surface Defects with Minimal Beam-Induced Damage
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 842-843
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- August 2018
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Determining Interplanar Distances from STEM-EDX Hyperspectral Maps
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 944-945
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- July 2016
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Quantitative High Resolution Chemical Analysis of the (PbxSn1−xSe)1+δTiSe2 Intergrowth System
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1327-1328
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- August 2015
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Using galvanostatic electroforming of Bi1–xSbx nanowires to control composition, crystallinity, and orientation
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- Journal of Materials Research / Volume 30 / Issue 2 / 28 January 2015
- Published online by Cambridge University Press:
- 03 December 2014, pp. 164-169
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- 28 January 2015
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Improving Bi2Te3-based thermoelectric nanowire microstructure via thermal processing
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- Journal of Materials Research / Volume 29 / Issue 2 / 28 January 2014
- Published online by Cambridge University Press:
- 03 January 2014, pp. 182-189
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- 28 January 2014
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HRTEM Analysis of Defect Structures in AIN Thin Films
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- Journal:
- Microscopy and Microanalysis / Volume 3 / Issue S2 / August 1997
- Published online by Cambridge University Press:
- 02 July 2020, pp. 677-678
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- August 1997
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