4 results
ToF-SIMS Investigations of Tip-Surface Chemical Interactions in Atomic Force Microscopy on a Combined AFM/ToF-SIMS Platform
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 2082-2083
- Print publication:
- July 2017
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Multi-Modal Processing of Graphene Towards Precisely Controlled Fabrication of a Nanoelectronic Device Using the Helium Ion Microscope and the TOF SIMS
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1720-1721
- Print publication:
- July 2017
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Multimodal Chemical and Functional Imaging of Nanoscale Transformations in Ferroelectric Thin Films
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1620-1621
- Print publication:
- July 2017
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Building with Ions: Development of In-situ Liquid Cell Microscopy for the Helium Ion Microscope.
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 754-755
- Print publication:
- July 2016
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