Skip to main content Accessibility help
×
Home

Multi-Modal Processing of Graphene Towards Precisely Controlled Fabrication of a Nanoelectronic Device Using the Helium Ion Microscope and the TOF SIMS

  • Songkil Kim (a1) (a2), Anton V. Ievlev (a1) (a2), Ivan V. Vlassiouk (a3), Matthew J. Burch (a1) (a2), Xiahan Sang (a1) (a2), Chance Brown (a1) (a4), Raymond R. Unocic (a1) (a2), Alex Belianinov (a1) (a2), Stephen Jesse (a1) (a2) and Olga S. Ovchinnikova (a1) (a2)...
    • Send article to Kindle

      To send this article to your Kindle, first ensure no-reply@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about sending to your Kindle. Find out more about sending to your Kindle.

      Note you can select to send to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be sent to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

      Find out more about the Kindle Personal Document Service.

      Multi-Modal Processing of Graphene Towards Precisely Controlled Fabrication of a Nanoelectronic Device Using the Helium Ion Microscope and the TOF SIMS
      Available formats
      ×

      Send article to Dropbox

      To send this article to your Dropbox account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your <service> account. Find out more about sending content to Dropbox.

      Multi-Modal Processing of Graphene Towards Precisely Controlled Fabrication of a Nanoelectronic Device Using the Helium Ion Microscope and the TOF SIMS
      Available formats
      ×

      Send article to Google Drive

      To send this article to your Google Drive account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your <service> account. Find out more about sending content to Google Drive.

      Multi-Modal Processing of Graphene Towards Precisely Controlled Fabrication of a Nanoelectronic Device Using the Helium Ion Microscope and the TOF SIMS
      Available formats
      ×

Abstract

  • An abstract is not available for this content so a preview has been provided below. To view the full text please use the links above to select your preferred format.

Copyright

References

Hide All
[1] Geim, A K & Novoselov, K S Nat. Mater 6 2007 183191.
[2] Kuila, T, et al, Prog. Mater Sci 57 2012 10611106.
[3] Kim, S, et al, Nanoscale 7 2015 1494614952.
[4] Iberi, V, et al, Sci. Rep 5 2015 11952.
[5] This work was supported by the Oak Ridge National Laboratory's Center for Nanophase Materials Sciences (CNMS), which is a U.S. Department of Energy, Office of Science User Facility.

Multi-Modal Processing of Graphene Towards Precisely Controlled Fabrication of a Nanoelectronic Device Using the Helium Ion Microscope and the TOF SIMS

  • Songkil Kim (a1) (a2), Anton V. Ievlev (a1) (a2), Ivan V. Vlassiouk (a3), Matthew J. Burch (a1) (a2), Xiahan Sang (a1) (a2), Chance Brown (a1) (a4), Raymond R. Unocic (a1) (a2), Alex Belianinov (a1) (a2), Stephen Jesse (a1) (a2) and Olga S. Ovchinnikova (a1) (a2)...

Metrics

Full text views

Total number of HTML views: 0
Total number of PDF views: 0 *
Loading metrics...

Abstract views

Total abstract views: 0 *
Loading metrics...

* Views captured on Cambridge Core between <date>. This data will be updated every 24 hours.

Usage data cannot currently be displayed