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D-89 Invited—Six Ways of Determining Film Thickness from High Resolution XRD Data
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- Journal:
- Powder Diffraction / Volume 24 / Issue 2 / June 2009
- Published online by Cambridge University Press:
- 20 May 2016, p. 171
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Nanoscale Strain Mapping in Embedded SiGe Devices by Dual Lens Dark Field Electron Holography and Precession Electron Diffraction
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1963-1964
- Print publication:
- August 2015
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A Comparison of Grain Size Measurements in Al-Cu Thin Films: Imaging Vs. Diffraction Techniques
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- Journal:
- Microscopy Today / Volume 10 / Issue 6 / November 2002
- Published online by Cambridge University Press:
- 14 March 2018, pp. 5-9
- Print publication:
- November 2002
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A Comparison of Grain Size Measurements in Al-Cu Thin Films: Imaging verses Diffraction Techniques
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- Journal:
- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 672-673
- Print publication:
- August 2002
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Texture Evolution in Al(Cu) Interconnect Materials
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- Journal:
- MRS Online Proceedings Library Archive / Volume 672 / 2001
- Published online by Cambridge University Press:
- 21 March 2011, O6.8
- Print publication:
- 2001
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