6 results
Multi-Species Focused Ion Beam Processing for III-V Semiconductor Materials
-
- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 616-617
- Print publication:
- July 2012
-
- Article
- Export citation
Ir/Au Ohmic Contacts on Bulk, Single-Crystal n-Type ZnO
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 1000 / 2007
- Published online by Cambridge University Press:
- 15 March 2011, 1000-L06-17
- Print publication:
- 2007
-
- Article
- Export citation
The Oxide/Nitride Interface: a study for gate dielectrics and field passivation
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 786 / 2003
- Published online by Cambridge University Press:
- 01 February 2011, E8.5
- Print publication:
- 2003
-
- Article
- Export citation
Gadolinium Oxide Gate Dielectrics for GaN MOSFETs
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 680 / 2001
- Published online by Cambridge University Press:
- 21 March 2011, E7.4
- Print publication:
- 2001
-
- Article
- Export citation
Electrical Characterization of GaN Metal Oxide Semiconductor Diode using Sc2O3 as the Gate Oxide
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 693 / 2001
- Published online by Cambridge University Press:
- 21 March 2011, I11.47.1
- Print publication:
- 2001
-
- Article
- Export citation
Device Processing for GaN High Power Electronics
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 622 / 2000
- Published online by Cambridge University Press:
- 15 March 2011, T7.1.1
- Print publication:
- 2000
-
- Article
- Export citation