2 results
Channel Strain Characterization in Semiconductor Device by Techniques Based on Transmission Electron Microscope
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 1349 / 2011
- Published online by Cambridge University Press:
- 13 September 2011, mrss11-1349-dd04-03
- Print publication:
- 2011
-
- Article
- Export citation
Transient Enhanced Diffusion and Dose Loss of Indium in Silicon
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 568 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 205
- Print publication:
- 1999
-
- Article
- Export citation