6 results
Probing Sources of Decoherence at Defects and Interfaces in Superconducting Quantum Materials and Devices
-
- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 1756-1757
- Print publication:
- August 2022
-
- Article
-
- You have access
- Export citation
Spatial Mapping of Electrostatics and Dynamics in Quantum Materials
-
- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 1436-1438
- Print publication:
- August 2021
-
- Article
-
- You have access
- Export citation
Emerging Opportunities in STEM to Characterize Soft-Hard Interfaces
-
- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 616-618
- Print publication:
- August 2021
-
- Article
-
- You have access
- Export citation
In-situ Observation of Out-of-plane Switching Filament in 2D Halide (PbI2)1-x(BiI3)x Memristor Under Operando Biasing
-
- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 848-849
- Print publication:
- August 2020
-
- Article
-
- You have access
- Export citation
Identification of Anion Sites in BiCuXO (X= Se, S) Heteroanionic Materials
-
- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 2106-2107
- Print publication:
- August 2019
-
- Article
-
- You have access
- Export citation
Electronic Biasing of Monolayer Transition Metal Dichalcogenides in a TEM
-
- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 1904-1905
- Print publication:
- August 2019
-
- Article
-
- You have access
- Export citation