4 results
Simulating Inelastic Scattering in Scanning Transmission Electron Microscopy using μSTEM
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1885-1886
- Print publication:
- August 2015
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The Contribution of Thermally Scattered Electrons to Atomic Resolution Elemental Maps
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1172-1173
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- August 2013
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Current Developments of Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 532-533
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- July 2012
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Channeling in Scanning Transmission Helium-Ion Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 698-699
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- July 2012
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