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Retarding Field Integrated Fluorescence and Electron Microscope
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- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue 1 / February 2021
- Published online by Cambridge University Press:
- 22 December 2020, pp. 109-120
- Print publication:
- February 2021
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Use of Negative Bias Potential for High Throughput Array Tomography in an Integrated Light-Electron Microscope
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 1050-1051
- Print publication:
- August 2019
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