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Use of Negative Bias Potential for High Throughput Array Tomography in an Integrated Light-Electron Microscope

Published online by Cambridge University Press:  05 August 2019

Ryan Lane ,
Yoram Vos ,
Pascal de Boer ,
Ben N.G. Giepmans  and
Jacob P. Hoogenboom
Ryan Lane*
Affiliation:
Imaging Physics, Delft University of Technology, Delft, The Netherlands.
Yoram Vos
Affiliation:
Imaging Physics, Delft University of Technology, Delft, The Netherlands.
Pascal de Boer
Affiliation:
Cell Biology, University Medical Centre Groningen, Groningen, The Netherlands.
Ben N.G. Giepmans
Affiliation:
Cell Biology, University Medical Centre Groningen, Groningen, The Netherlands.
Jacob P. Hoogenboom
Affiliation:
Imaging Physics, Delft University of Technology, Delft, The Netherlands.
*
*Corresponding author: r.i.lane@tudelft.nl

Abstract

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Type
Multi-Modal, Large-Scale and 3D Correlative Microscopy
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1050 - 1051
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Briggman, K and Bock, D, Current Opinion in Neurobiology 22 (2012), p. 154-161.Google Scholar
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[3]Kuipers, J et al. , Experimental Cell Research 337 (2015), p. 202-207.Google Scholar
[4]Bouwer, J et al. , Advanced Structural Chemical Imaging 2 (2016), p. 11.Google Scholar