5 results
Development of New Analytical Approaches by a 300 keV CFE-TEM/STEM
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- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1780-1781
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- August 2006
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Measures to Reduce X-ray Noise in a CCD High Quality Image Camera for HVEM
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- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 614-615
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- August 2005
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Eleven Thousand Interference Fringes by 1-MV Field Emission Electron Microscope
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- Journal:
- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 524-525
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- August 2002
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Development of a 1MV-Field-Emission Electron Microscope II. Performance
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- Journal:
- Microscopy and Microanalysis / Volume 6 / Issue S2 / August 2000
- Published online by Cambridge University Press:
- 02 July 2020, pp. 1140-1141
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- August 2000
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Development of a 1MV-Field-Emission Electron Microscope I. Instrument
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- Journal:
- Microscopy and Microanalysis / Volume 6 / Issue S2 / August 2000
- Published online by Cambridge University Press:
- 02 July 2020, pp. 1138-1139
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- August 2000
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