4 results
Xe Plasma vs Gallium FIB Delayering
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 904-905
- Print publication:
- August 2019
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Exploring Li distribution in Li-ion batteries with FIB-SEM and TOF-SIMS
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 370-371
- Print publication:
- August 2018
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Site-Specific Manipulation of CNTs to EXpressLO™ Grids for TEM Analysis
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1744-1745
- Print publication:
- July 2016
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DualBeam Milling and Deposition of Complex Structures Using Bitmap Files and Digital Patterning
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- Journal:
- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 1154-1155
- Print publication:
- August 2004
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