13 results
Large-Aperture STEM Hexapole Cs-Corrector
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 2630-2632
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- August 2022
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Benefits of Chromatic Aberration Correction for Off-axis Electron Holography
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 588-589
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- August 2013
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Automated and Objective Numerical Aberration Correction of HRTEM Complex Exit Waves of Crystal Lattices
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 586-587
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- August 2013
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Low-Voltage Atomic-Resolution Off-Axis Holography on Hexagonal Boron Nitride
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1222-1223
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- August 2013
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Low-voltage off-axis electron holography in the TEAM I microscope: pure phase contrast of beam sensitive objects
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 478-479
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- July 2012
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NMR studies of benzene mobility in metal-organic framework MOF-5
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- Journal:
- The European Physical Journal - Applied Physics / Volume 55 / Issue 2 / August 2011
- Published online by Cambridge University Press:
- 11 August 2011, 20702
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- August 2011
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Prospects for Off-Axis Electron Holography in the TEAM I Microscope
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- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1238-1239
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- July 2011
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Mapping Intrinsic Electric Fields Through Off-Axis Electron Holography: Prospects and Problems
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 582-583
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- July 2010
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New Possibilities for Off-axis Electron Holography by Hardware Aberration Correctors
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 94-95
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- July 2010
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Aberration Correction and Electron Holography
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 1460-1461
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- July 2009
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Characterization of the holography performance of a Titan 80-300 with high brightness Schottky electron gun and image Cs-corrector at 300kV acceleration voltage
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 1098-1099
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- July 2009
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Improved Performance of Electron Holography with Tecnai F20 Cs-corr
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- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S03 / September 2007
- Published online by Cambridge University Press:
- 07 September 2007, pp. 36-37
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- September 2007
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Optimum Imaging Conditions for Recording High-Resolution Electron Holograms in a Cs-corrected TEM
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- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S03 / September 2007
- Published online by Cambridge University Press:
- 07 September 2007, pp. 32-33
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- September 2007
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