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Wide-spectral-range, Expanded-beam Spectroscopic Ellipsometer and its Application for Imaging/Mapping of Graded Nanocrystalline Si:H Films
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1321 / 2011
- Published online by Cambridge University Press:
- 19 July 2011, mrss11-1321-a08-03
- Print publication:
- 2011
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- Article
- Export citation