5 results
Measuring Near-Room-Temperature Valence Transition in Strained Perovskite Oxide using STEM-EELS
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 2416-2417
- Print publication:
- August 2022
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Ar+ FIB Milling and Measurement of FIB Damage in Silicon
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 886-887
- Print publication:
- August 2019
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Strain and Sn distribution in Ge/Ge1−xSnx Core-Shell Nanowires
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 2146-2147
- Print publication:
- August 2019
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New Workflows Broaden Access to S/TEM Analysis and Increase Productivity
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- Journal:
- Microscopy Today / Volume 26 / Issue 1 / January 2018
- Published online by Cambridge University Press:
- 05 January 2018, pp. 18-25
- Print publication:
- January 2018
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Ga+ FIB Milling and Measurement of FIB Damage in Sapphire
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 346-347
- Print publication:
- August 2014
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