4 results
Enhanced Preparation Technique of Plan-view Specimens for in situ TEM Heating Experiments based on the Synergy of Wedge-polishing and FIB
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 2300-2301
- Print publication:
- August 2022
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Understanding the structural evolution and stability of a Ge-Sn alloy at the nanoscale through in situ TEM heating
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- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 1486-1487
- Print publication:
- August 2021
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Optical properties of defects in nitride semiconductors
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- Journal:
- Journal of Materials Research / Volume 30 / Issue 20 / 28 October 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 2977-2990
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- 28 October 2015
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Burgers Vector Analysis of Vertical Dislocations in Ge Crystals by Large-Angle Convergent Beam Electron Diffraction
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue 3 / June 2015
- Published online by Cambridge University Press:
- 05 May 2015, pp. 637-645
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- June 2015
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