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X-ray metrology for advanced microelectronics
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- Journal:
- The European Physical Journal - Applied Physics / Volume 49 / Issue 2 / February 2010
- Published online by Cambridge University Press:
- 26 January 2010, 20101
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- February 2010
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Transmission Electron Microscopy Study of FeHfN Thin Films for Magnetic Properties Optimization and Integration Above Silicon Circuits.
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- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 1804-1805
- Print publication:
- August 2005
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Growth by Low Pressure Chemical Vapor Deposition of Silicon Quantum Dots on Insulator for Nanoelectronics Devices
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- Journal:
- MRS Online Proceedings Library Archive / Volume 571 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 37
- Print publication:
- 1999
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High Slope Efficiency and Low Threshold in a Diode Pumped Epitaxially Grown Yb:YAG Waveguide Laser
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- Journal:
- MRS Online Proceedings Library Archive / Volume 329 / 1993
- Published online by Cambridge University Press:
- 15 February 2011, 179
- Print publication:
- 1993
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Room Temperature CW Laser Efficiency Yb3+−Er3+ and Tm3+ Doped Silicates in the Infrared Region
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- Journal:
- MRS Online Proceedings Library Archive / Volume 329 / 1993
- Published online by Cambridge University Press:
- 15 February 2011, 253
- Print publication:
- 1993
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