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Scanning Probe Microscopy (SPM) for the Investigation of Local Electrical Properties of High-K Dielectric/Ferroelectric Films
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- Journal:
- MRS Online Proceedings Library Archive / Volume 567 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 567
- Print publication:
- 1999
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- Article
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Influence Of Silicon Defects On The Electrical Behavior Of Semiconductor Power Devices
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- Journal:
- MRS Online Proceedings Library Archive / Volume 483 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 381
- Print publication:
- 1997
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- Article
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