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Spatially Resolved Electroluminescence of InGaN-MQW-LEDs

Published online by Cambridge University Press:  03 September 2012

Veit Schwegler
Affiliation:
Dept. of Optoelectronics, University of Ulm, 89069 Ulm, Germany
Matthias Seyboth
Affiliation:
Dept. of Optoelectronics, University of Ulm, 89069 Ulm, Germany
Christoph Kirchner
Affiliation:
Dept. of Optoelectronics, University of Ulm, 89069 Ulm, Germany
Marcus Scherer
Affiliation:
Dept. of Optoelectronics, University of Ulm, 89069 Ulm, Germany
Markus Kamp
Affiliation:
Dept. of Optoelectronics, University of Ulm, 89069 Ulm, Germany
Peter Fischer
Affiliation:
“Otto-von-Guericke” University, Institute of Experimental Physics, Germany
Jürgen Christen
Affiliation:
“Otto-von-Guericke” University, Institute of Experimental Physics, Germany
Margit Zacharias
Affiliation:
“Otto-von-Guericke” University, Institute of Experimental Physics, Germany
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Abstract

Electroluminescence (EL) is the most significant measure for light-emitting diodes since it probes the most relevant properties of the fully processed device during operation. In addition to the information gained by conventional spectrally resolved EL, scanning micro-EL provides spatially resolved information. The devices under investigation are InGaN/GaN-LEDs with single peak band-band emission at about 400 nm grown by MOVPE on sapphire substrates.

The μ-EL-characterization is performed as a function of injection current densities and the emission is investigated from the epitaxial layer as well as from substrate side. Spatially resolved wavelength images reveal emission peaks between 406 nm and 417 nm, corresponding either to In fluctuations of 1%–1.5% or local fluctuations of piezo electric fields. Beside the information on the emission wavelength fluctuations ν-EL is used to determine the temperature distribution in the LEDs and to investigate transparent contacts.

Type
Research Article
Copyright
Copyright © Materials Research Society 1999

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References

1. Fischer, P., Christen, J., Zacharias, M., Schwegler, V., Kirchner, C., and Kamp, M., Appl. Phys. Lett., 75, 3440 (1999).CrossRefGoogle Scholar
2. Zolina, K.G., Kudryashov, V. E., Turkin, A.N., and Yunovich, A.E., Semiconductors, 31, 901 (1997).CrossRefGoogle Scholar
3. Schwegler, V., Seyboth, M., Schad, S., Scherer, M., Kirchner, C., Kamp, M., Stempfle, U., Limmer, W., and Sauer, R., submitted to Proc. of MRS, 595 (2000).Google Scholar
4. Mukai, T., Takekawa, K., Nakamura, S., Jpn. J. Appl. Phys., 37, L839 (1998).CrossRefGoogle Scholar

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