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A New Improved Silicon Multi-Cathode Detector (SMCD) for Microanalysis and X-Ray Mapping Applications

Published online by Cambridge University Press:  14 March 2018

Shaul Barkan
Affiliation:
Radiant Detector Technologies
Valeri D. Saveliev
Affiliation:
Radiant Detector Technologies
Jan S. Iwanczyk
Affiliation:
Radiant Detector Technologies
Liangyuan Feng
Affiliation:
Radiant Detector Technologies
Carolyn R. Tull
Affiliation:
Radiant Detector Technologies
Bradley E. Patt
Affiliation:
Radiant Detector Technologies
Dale E. Newbury
Affiliation:
National Institute of Standards and Technology
John A. Small
Affiliation:
National Institute of Standards and Technology
Nestor J. Zaluzec
Affiliation:
Electron Microscopy Center, Argonne National Lab

Extract

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A silicon multi-cathode detector (SMCD) has been developed for microanalysis and x-ray mapping applications. The SMCD has a large active area (∼0.5 cm2), excellent energy resolution, and high count rate capability. The detector utilizes novel structures that have produced very low dark current, high electric field, uniform charge collection, low noise and high sensitivity to low energy x-rays. The detector's spectral response was evaluated using a 55Fe radioisotope source, as well as by fluorescing materials with an x-ray generator. Figure 1 shows a 55Fe spectrum with an energy resolution of 125 eV FWHM at 5.9 keV collected at 12 μs peaking time. This energy resolution has been repeatably measured on many different detectors. To evaluate the high count rate x-ray performance, which is very important for fast x-ray mapping, a Cu sample was fluoresced using a Rh-anode x-ray tube.

Type
Research Article
Copyright
Copyright © Microscopy Society of America 2004

References

[1] Barkan, S., et al., “Vortex® – A new high performance silicon drift detector for XRD and XRF Applications”, Advances in X-Ray Analysis, Vol. 46 (2003) 332337.Google Scholar
[2] Feng, L., et al., “A New High Performance Silicon Multi-cathode Detector for XRD and XRF Applications”, Hard X-ray and Gamma-ray Detector Physics V, Proceedings of SPIE, International Society of Optical Engineering, Vol. 5198, (2004) 103110.Google Scholar
[3] Iwanczyk, J. S., et al., “Large Area Silicon Drift Detectors for X-Rays- New Results”, IEEE Trans. Nucl. Sci. vol. 46 (1999) 284288.Google Scholar
[4]U.S Patent #6,455,858 B1 “Semiconductor Radiation Detector”, 2002.Google Scholar