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Lateral and Chemical Force Microscopy Mapping Surface Friction and Adhesion

Published online by Cambridge University Press:  14 March 2018

M.G. Heaton ,
C.B. Prater  and
K.J. Kjoller
M.G. Heaton
Affiliation:
Digital Instruments
C.B. Prater
Affiliation:
Digital Instruments
K.J. Kjoller
Affiliation:
Digital Instruments

Extract

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Lateral Force Microscopy (LFU) is a scanning probe microscopy (SPM) technique that identifies and maps relative differences in surface frictional characteristics. It is one of several techniques developed as extensions to the basic topographical mapping capabilities of SPM. LFM is particularly useful for differentiating among materials on surfaces. Applications include identifying transitions between different components in polymer blends, composites and other mixtures, identifying organic and other contaminants on surfaces, delineating coverage by coatings and other surface layers, and chemical force microscopy using functionalized tips.

Type
Research Article
Information
Microscopy Today , Volume 3 , Issue 9 , November 1995 , pp. 14 - 15
Copyright
Copyright © Microscopy Society of America 1995

References

CD, Frisbie, A, Rozsnyai, A, Noy, MS, Wrighton, and CM, Lieber, 1994 . Functional group imaging by chemical force microscopy Science 265 2071-2074.Google Scholar