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ETEM Issues and Opportunities for Dynamic In-situ Experiments

Published online by Cambridge University Press:  14 March 2018

Edward D. Boyes  and
Pratibha L. Gai
Edward D. Boyes*
Affiliation:
DuPont Company, CR&D, Wilmington, DE, USA
Pratibha L. Gai
Affiliation:
DuPont Company, CR&D, Wilmington, DE, USA
*
Edward.D.Boyes@USA.dupont.com

Extract

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Many dynamic processes do not occur in nature, science or industry in a typical TEM high (and sometimes not so high) vacuum environment. Dynamic in-situ data related to the real world need to be obtained under Controlled conditions of gas/vapor/liquid environment and temperature. In the ETEM (Environmental Transmission Electron Microscope), the specimen - but nothing much else - is shared between the chemical reactor on the horizontal axis and the vertical microscope column (Fig.1). The original Philips CM30 column is highly modified with pressure limiting apertures around the beam and multiple stages of differential pumping (Fig.2).

Type
Research Article
Information
Microscopy Today , Volume 12 , Issue 4 , July 2004 , pp. 24 - 27
Copyright
Copyright © Microscopy Society of America 2004

References

1. Gai, P L, Cat Rev Sci Eng, 34 (1992)1.Google Scholar
2. Gai, P L and Boyes, E D, “Electron Microscopy in Heterogeneous Catalysis, Institute of Physics Publ., Bristol, 2003.CrossRefGoogle Scholar
3. Gat, P L, Lavin, G and Boyes, E D, Electron Microcopy (Proc ICEM 14), publd, IOP, 3 (1998) 501.Google Scholar
4. Sinclair, R, Yamashita, T and Ponce, F A, Nature 290 (1981) 386.CrossRefGoogle Scholar
5. Bordia, R, Boyes, E D and Jagota, A, Proc MRS, 249 (1992) 475.Google Scholar
6. Gai, P L, Boyes, E D and Bart, J D, Phil Mag. A45 (1982) 531.CrossRefGoogle Scholar
7. Butler, E P and Hale, K F, Dynamic Experiments in the EM, publd North Holland, Amsterdam 1981.Google Scholar
8. Boyes, E D and Gai, P L, Ultramicroscopy, 67 (1997) 219.CrossRefGoogle Scholar
9. Double, D D, Hellawell, A and Perry, S. J., Proc Roy Soc A359 (1978) 435.Google Scholar
10. Hansen, T W et al, Science 294 (2001) 1508.CrossRefGoogle Scholar
11. Olesko, V P et al, J Electron Microscopy 51 (2002) 527.Google Scholar
12. Gai, P L et al, J Microscopy 142 (1986) 9.CrossRefGoogle Scholar