Opticai and election microscopy have been used extensively as problem solving tools in the graphic arts industry. Atomic force microscopy (AFM) is a complementary tool to optical and electron microscopy - it provides a high resolution view of areas 150 mm by 150 mm and smaller, images may be viewed in three dimensions and imaging can take place in either air, under liquid, or in a vacuum.

AFM can be used for more than just the three-dimensional imaging of nanoscale features on a sample surface; it can detect friction, adhesion, compliance, thermal properties, and even magnetic signals. AFM images are stored digitally and so the data can be enhanced and viewed in many rays. Algorithms allow the display of a line profile across the image surface at any desired location along with quantitative height information. Average roughness data can also be calculated.