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The Scanning Electron Microscopy (SEM) And Energy Dispersive X-Ray Spectroscopy (EDS) For The Study Of The High Temperature Oxidation Mecanisms. The Microscopy In The Center 0f The 0thers Techniques (XPS, XRD, RAMAN and Glow Discharge…).

Published online by Cambridge University Press:  21 July 2003

M. Lameille ,
E. Buiret  and
C. Berthier
M. Lameille
Affiliation:
CEA, CE SACLAY, DCC/DPE, 91191 Gif sur Yvette Cedex FRANC
E. Buiret
Affiliation:
CEA, CE SACLAY, DCC/DPE, 91191 Gif sur Yvette Cedex FRANC
C. Berthier
Affiliation:
CEA, CE IDF/DPTA/SP2A/LEMI 91680 Bruyeres le Chate

Abstract

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Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 634 - 635
Copyright
Copyright © Microscopy Society of America 2003