<span class="italic">Scanning Electron Microscopy and X-Ray Microanalysis</span>. 
    J. Goldstein, D. Newbury, D. Joy, C, Lyman, P. Echlin, E. Lifshin, 
    L. Sawyer, and J. Michael. Kluwer Academic, Plenum Publishers, New York; 
    2003, 688 pages (Hardback, $75.00) ISBN 0-306-47292-9

Sandy Burany

doi:10.1017/S1431927603030617

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Volume 9, Issue 5
October 2003 , p. 484

Scanning Electron Microscopy and X-Ray Microanalysis. J. Goldstein, D. Newbury, D. Joy, C, Lyman, P. Echlin, E. Lifshin, L. Sawyer, and J. Michael. Kluwer Academic, Plenum Publishers, New York; 2003, 688 pages (Hardback, $75.00) ISBN 0-306-47292-9

Sandy Burany ^(a1)

- DOI: https://doi.org/10.1017/S1431927603030617
- Published online by Cambridge University Press: 16 September 2003

Extract

It is a pleasure to review the third edition of Scanning Electron Microscopy and X-Ray Microanalysis. The 15 chapter book can be divided into three sections: (1) scanning electron microscopy, (2) X-ray microanalysis, and (3) specimen preparation.

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Cited by 6
Cited by
- 6
Crossref Citations

This article has been cited by the following publications. This list is generated based on data provided by CrossRef.

SLÓWKO, W. 2006. New system for secondary electron detection in variable-pressure scanning electron microscopy. Journal of Microscopy, Vol. 224, Issue. 1, p. 97.

CrossRef

Google Scholar

Kliewer, Chris E. Kiss, Gabor and DeMartin, Gregory J. 2006. Ex Situ Transmission Electron Microscopy: A Fixed-Bed Reactor Approach. Microscopy and Microanalysis, Vol. 12, Issue. 02, p. 135.

CrossRef

Google Scholar

BETZ, OLIVER WEGST, ULRIKE WEIDE, DANIELA HEETHOFF, MICHAEL HELFEN, LUKAS LEE, WAH-KEAT and CLOETENS, PETER 2007. Imaging applications of synchrotron X-ray phase-contrast microtomography in biological morphology and biomaterials science. I. General aspects of the technique and its advantages in the analysis of millimetre-sized arthropod structure. Journal of Microscopy, Vol. 227, Issue. 1, p. 51.

CrossRef

Google Scholar

Dankházi, Zoltán Kalácska, Szilvia Baris, Adrienn Varga, Gábor Radi, Zsolt and Havancsák, Károly 2015. EBSD Sample Preparation: High Energy Ar Ion Milling. Materials Science Forum, Vol. 812, Issue. , p. 309.

CrossRef

Google Scholar

Hajmirzaheydarali, M Akbari, M Soleimani-Amiri, S Sadeghipari, M Shahsafi, A Akhavan Farahani, A and Mohajerzadeh, S 2015. Vertically etched silicon nano-rods as a sensitive electron detector. Journal of Micromechanics and Microengineering, Vol. 25, Issue. 7, p. 074003.

CrossRef

Google Scholar

Karunakaran, Chithra Lahlali, Rachid Zhu, Ning Webb, Adam M. Schmidt, Marina Fransishyn, Kyle Belev, George Wysokinski, Tomasz Olson, Jeremy Cooper, David M. L. and Hallin, Emil 2015. Factors influencing real time internal structural visualization and dynamic process monitoring in plants using synchrotron-based phase contrast X-ray imaging. Scientific Reports, Vol. 5, Issue. 1,

CrossRef

Google Scholar

Google Scholar Citations

View all Google Scholar citations for this article.

Scopus Citations

View all citations for this article on Scopus

Volume 9, Issue 5
October 2003 , p. 484

Scanning Electron Microscopy and X-Ray Microanalysis. J. Goldstein, D. Newbury, D. Joy, C, Lyman, P. Echlin, E. Lifshin, L. Sawyer, and J. Michael. Kluwer Academic, Plenum Publishers, New York; 2003, 688 pages (Hardback, $75.00) ISBN 0-306-47292-9

Sandy Burany ^(a1)

- DOI: https://doi.org/10.1017/S1431927603030617
- Published online by Cambridge University Press: 16 September 2003

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Scanning Electron Microscopy and X-Ray Microanalysis. J. Goldstein, D. Newbury, D. Joy, C, Lyman, P. Echlin, E. Lifshin, L. Sawyer, and J. Michael. Kluwer Academic, Plenum Publishers, New York; 2003, 688 pages (Hardback, $75.00) ISBN 0-306-47292-9

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Scanning Electron Microscopy and X-Ray Microanalysis. J. Goldstein, D. Newbury, D. Joy, C, Lyman, P. Echlin, E. Lifshin, L. Sawyer, and J. Michael. Kluwer Academic, Plenum Publishers, New York; 2003, 688 pages (Hardback, $75.00) ISBN 0-306-47292-9

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