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Scanning Electron Microscopy and X-Ray Microanalysis. J. Goldstein, D. Newbury, D. Joy, C, Lyman, P. Echlin, E. Lifshin, L. Sawyer, and J. Michael. Kluwer Academic, Plenum Publishers, New York; 2003, 688 pages (Hardback, $75.00) ISBN 0-306-47292-9

Published online by Cambridge University Press:  16 September 2003

Sandy Burany
Sandy Burany
Affiliation:
Accurel Systems International Corp., 11155 Leveton Drive, Tualatin, OR 97062
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Extract

It is a pleasure to review the third edition of Scanning Electron Microscopy and X-Ray Microanalysis. The 15 chapter book can be divided into three sections: (1) scanning electron microscopy, (2) X-ray microanalysis, and (3) specimen preparation.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 9 , Issue 5 , October 2003 , pp. 484
Copyright
© 2003 Microscopy Society of America

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