Hostname: page-component-7479d7b7d-k7p5g Total loading time: 0 Render date: 2024-07-08T10:33:02.350Z Has data issue: false hasContentIssue false
  • English
  • Français

Research Grade Remote-Access Scanning Electron Microscopy: The Evolution of the Bugscope Project

Published online by Cambridge University Press:  24 July 2003

Glenn Fried ,
Scott Robinson ,
Don Appleman ,
Ben Grosser ,
Daniel Weber  and
Chas Conway
Glenn Fried
Affiliation:
Imaging Technology Group, Beckman Institute for Advanced Science and Technology, University of Illinois, UrbanaIL, 61801
Scott Robinson
Affiliation:
Imaging Technology Group, Beckman Institute for Advanced Science and Technology, University of Illinois, UrbanaIL, 61801
Don Appleman
Affiliation:
Imaging Technology Group, Beckman Institute for Advanced Science and Technology, University of Illinois, UrbanaIL, 61801
Ben Grosser
Affiliation:
Imaging Technology Group, Beckman Institute for Advanced Science and Technology, University of Illinois, UrbanaIL, 61801
Daniel Weber
Affiliation:
Imaging Technology Group, Beckman Institute for Advanced Science and Technology, University of Illinois, UrbanaIL, 61801
Chas Conway
Affiliation:
Imaging Technology Group, Beckman Institute for Advanced Science and Technology, University of Illinois, UrbanaIL, 61801

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 1258 - 1259
Copyright
Copyright © Microscopy Society of America 2003