Hostname: page-component-7bb8b95d7b-fmk2r Total loading time: 0 Render date: 2024-09-25T00:14:03.478Z Has data issue: false hasContentIssue false
  • English
  • Français

Performing Micro X-ray Fluorescence Analysis in SEM with an Integrated Xray Generator Based Upon Polycapillary Optic Technology

Published online by Cambridge University Press:  01 August 2003

Ning Gao ,
Tom Bievenue ,
Ian Radley ,
Brian Cross  and
Jim Nicolino
Ning Gao
Affiliation:
X-Ray Optical Systems, Inc., 30 Corporate Circle, Albany, NY 12203
Tom Bievenue
Affiliation:
X-Ray Optical Systems, Inc., 30 Corporate Circle, Albany, NY 12203
Ian Radley
Affiliation:
X-Ray Optical Systems, Inc., 30 Corporate Circle, Albany, NY 12203
Brian Cross
Affiliation:
CrossRoads Scientific, 414 Av. Portola, P.O. Box 1823, El Granada, CA 94018-1823
Jim Nicolino
Affiliation:
IXRF Systems, Inc., 15715 Brookford Drive, Houston, TX 77059

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 1276 - 1277
Copyright
Copyright © Microscopy Society of America 2003