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Highly Accurate Real Space Nanometrology Using Revolving Scanning Transmission Electron Microscopy

  • J. H. Dycus (a1), J. S. Harris (a1), X. Sang (a1), C. M. Fancher (a1), S. D. Findlay (a2), A. A. Oni (a1), T. E. Chan (a1), C. C. Koch (a1), J. L. Jones (a1), L. J. Allen (a3), D. L. Irving (a1) and J. M. LeBeau (a1)...
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[1] Pennycook, S. J. & Jesson, D. E., Physical Review Letters 64 (1990). p 938.
[2] Dycus, J. H, et. al., Applied Physics Letters 102 (2013). p. 081601.
[3] Sang, X. & LeBeau, J. M., Ultramicroscopy (2014) 2835.
[4] Sang, X., et. al., Microscopy and Microanalysis (2014) 17641771.
[5] JHD, , WX, , XS, & JML, gratefully acknowledge support from the Air Force Office of Scientific Research (Grant No. FA9550-14-1-0182). SDF and LJA acknowledge support under the Australian Research Council's Discovery Projects funding scheme (DP140102538 and DP110102228). JHD acknowledges the National Science Foundation Graduate Research Fellowship (Grant DGE-1252376). The authors acknowledge the Analytical Instrumentation Facility (AIF) at North Carolina State University, supported by the State of North Carolina and the National Science Foundation.

Highly Accurate Real Space Nanometrology Using Revolving Scanning Transmission Electron Microscopy

  • J. H. Dycus (a1), J. S. Harris (a1), X. Sang (a1), C. M. Fancher (a1), S. D. Findlay (a2), A. A. Oni (a1), T. E. Chan (a1), C. C. Koch (a1), J. L. Jones (a1), L. J. Allen (a3), D. L. Irving (a1) and J. M. LeBeau (a1)...

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