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Ion microprobe analysis of laser-deposited Y–Ba–Cu thin film: Effects of anneal temperature

Published online by Cambridge University Press:  31 January 2011

Y. L. Wang ,
R. Levi-Setti ,
J. M. Chabala ,
T. Venkatesan ,
X. D. Wu ,
A. Inam  and
B. Dutta
Y. L. Wang
Affiliation:
The Enrico Fermi Institute and Department of Physics, University of Chicago, 5640 South Ellis Avenue, Chicago, Illinois 60637
R. Levi-Setti
Affiliation:
The Enrico Fermi Institute and Department of Physics, University of Chicago, 5640 South Ellis Avenue, Chicago, Illinois 60637
J. M. Chabala
Affiliation:
The Enrico Fermi Institute and Department of Physics, University of Chicago, 5640 South Ellis Avenue, Chicago, Illinois 60637
T. Venkatesan
Affiliation:
Bell Communications Research, Red Bank, New Jersey 07701
X. D. Wu
Affiliation:
Physics Department, Rutgers University, Piscataway, New Jersey 08854
A. Inam
Affiliation:
Physics Department, Rutgers University, Piscataway, New Jersey 08854
B. Dutta
Affiliation:
Physics Department, Middlebury College, Middlebury, Vermont 05753
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Abstract

We have employed high spatial resolution (<50 nm) SIMS to study thin film deposited on SrTiO3, produced by pulsed laser evaporation of bulk stoichiometric YBa2Cu3Ox pellets derived from either BaCO3 or Ba3N2. The grain growth, film-substrate interaction, and carbon contamination of the films were examined as a function of post-deposition anneal temperature ranging between 700 °C and 900 °C. On the surface of both types of film, we found overgrowth crystals, which are enriched in copper, that increased in size from a few tenths of a micron to several microns with increasing anneal temperature. Above 800 °C, the film forms a polycrystalline structure with grain size of ∼1 micron. With increasing anneal temperature, more strontium was observed on the surface of the film. Films prepared from YBa2Cu3Ox targets derived from BaCO3 and Ba3N2 were both contaminated with carbon: however, only the former showed segregated carbon along the grain boundaries of the polycrystalline film annealed at 900 °C.

Type
Articles
Information
Journal of Materials Research , Volume 4 , Issue 5 , October 1989 , pp. 1087 - 1092
Copyright
Copyright © Materials Research Society 1989

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References

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