Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by
Crossref.
Fartash, A.
1992.
Young’s modulus of a thin film determined from the peak shifts of its membrane modes.
Applied Physics Letters,
Vol. 61,
Issue. 17,
p.
2024.
Vlassak, J.J.
and
Nix, W.D.
1992.
A new bulge test technique for the determination of Young's modulus and Poisson's ratio of thin films.
Journal of Materials Research,
Vol. 7,
Issue. 12,
p.
3242.
Baker, Shefford P.
Small, Martha K.
Vlassak, Joost J.
Daniels, Brian J.
and
Nix, W. D.
1993.
Mechanical Properties and Deformation Behavior of Materials Having Ultra-Fine Microstructures.
p.
165.
Jean, A.
El Khakani, M. A.
Chaker, M.
Boily, S.
Gat, E.
Kieffer, J. C.
Pépin, H.
Ravet, M. F.
and
Rousseaux, F.
1993.
Biaxial Young’s modulus of silicon carbide thin films.
Applied Physics Letters,
Vol. 62,
Issue. 18,
p.
2200.
Small, Martha K.
Vlassak, Joost J.
Powell, Stephen F.
Daniels, Brian J.
and
Nix, William D.
1993.
Accuracy and Reliability of Bulge Test Experiments.
MRS Proceedings,
Vol. 308,
Issue. ,
De Graef, Marc
and
Clarke, David R.
1993.
Measurement of residual stress in MgO thin films on GaAs by electron microscopy.
Applied Physics Letters,
Vol. 63,
Issue. 8,
p.
1044.
Brotzen, Franz R.
1994.
Surface Engineering.
p.
642.
Cammarata, R.C
1994.
Mechanical properties of nanocomposite thin films.
Thin Solid Films,
Vol. 240,
Issue. 1-2,
p.
82.
Hohlfelder, Robert J
Vlassak, Joost J.
Nix, William D.
Luo, Huihong
and
Chidsey, Christopher E.D.
1994.
Blister Test Analysis Methods.
MRS Proceedings,
Vol. 356,
Issue. ,
Paviot, V. M.
Vlassak, J. J.
and
Nix, W. D.
1994.
Measuring the Mechanical Properties of Thin Metal Films by Means of Bulge Testing of Micromachined Windows.
MRS Proceedings,
Vol. 356,
Issue. ,
Sussmann, R.S.
Brandon, J.R.
Scarsbrook, G.A.
Sweeney, C.G.
Valentine, T.J.
Whitehead, A.J.
and
Wort, C.J.H.
1994.
Properties of bulk polycrystalline CVD diamond.
Diamond and Related Materials,
Vol. 3,
Issue. 4-6,
p.
303.
Liddle, J. Alexander
Huggins, H.A.
Mulgrew, P.
Harriott, L.R.
Wade, H.H.
and
Bolan, K.
1994.
Fracture Strength of Thin Ceramic Membranes.
MRS Proceedings,
Vol. 338,
Issue. ,
Brotzen, F. R.
1994.
Mechanical testing of thin films.
International Materials Reviews,
Vol. 39,
Issue. 1,
p.
24.
Small, Martha K.
Daniels, Brian J.
Clemens, Bruce M.
and
Nix, William D.
1994.
The elastic biaxial modulus of Ag–Pd multilayered thin films measured using the bulge test.
Journal of Materials Research,
Vol. 9,
Issue. 1,
p.
25.
Baker, Shefford P.
and
Nix, William D.
1994.
Intrinsic stresses in compositionally modulated Au-Ni thin films and the supermodulus effect.
Journal of Materials Research,
Vol. 9,
Issue. 12,
p.
3145.
Valentine, T.J.
Whitehead, A.J.
Sussmann, R.S.
Wort, C.J.H.
and
Scarsbrook, G.A.
1994.
Mechanical property measurements of bulk polycrystalline CVD diamond.
Diamond and Related Materials,
Vol. 3,
Issue. 9,
p.
1168.
Cammarata, R. C.
1994.
Nanophase Materials.
p.
293.
Heinen, D.
Bohn, H. G.
and
Schilling, W.
1995.
On the mechanical strength of free-standing and substrate-bonded Al thin films.
Journal of Applied Physics,
Vol. 77,
Issue. 8,
p.
3742.
Sizemore, Jim
Hohlfelder, R. J.
Vlassak, J. J.
and
Nix, W. D.
1995.
Measuring the Adhesion of Diamond Thin Films to Substrates Using the Blister Test.
MRS Proceedings,
Vol. 383,
Issue. ,
Jankowski, Alan F.
1995.
Metallic multilayers at the nanoscale.
Nanostructured Materials,
Vol. 6,
Issue. 1-4,
p.
179.