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Morphology and Growth Habit of a Novel Flux-Grown Layered Semiconductor KBiS2 Revealed by Lab-based Diffraction-Contrast Tomography
- Journal: Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press: 22 July 2022, pp. 278-279
- Print publication: August 2022
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