4 results
Strain Analysis of FinFET Device Utilizing Moiré Fringes in Scanning Transmission Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 978-979
- Print publication:
- August 2018
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Near Shadowless EDS Tomography for Sliced Sample Realized by X-ray Collection with One Large Sized SDD Detector
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1084-1085
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- July 2017
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Rapid 3D Reconstruction in the EDS Tomography by using Iterative Series Reduction (ISER) Method
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1605-1606
- Print publication:
- August 2015
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Image Collection using an Auto Data Acquisition System and An Application to Ice embedded Ribosome
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 1114-1115
- Print publication:
- August 2014
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