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In-situ TEM imaging of Novel Edge Reconstruction in Bilayer Phosphorene
- Journal: Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press: 22 July 2022, pp. 2310-2311
- Print publication: August 2022
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In-situ Imaging of Anisotropic Layer-by-layer Phase Transition in Few-layer MoTe2
- Journal: Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press: 22 July 2022, pp. 2320-2322
- Print publication: August 2022
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Unidirectional Assembly on Distorted Two-Dimensional Crystal Substrates
- Journal: Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press: 30 July 2021, pp. 892-893
- Print publication: August 2021
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TEM Imaging of Edges and Point Defects in Monolayer Phosphorene
- Journal: Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press: 30 July 2020, pp. 2348-2350
- Print publication: August 2020
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TEM Imaging and Electron Diffraction of Vertically Stacked Graphene/h-BN with Fine Control of Twist Angle
- Journal: Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press: 05 August 2019, pp. 2114-2115
- Print publication: August 2019
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Atomic-Resolution TEM Imaging of Phosphorene Protected by Graphene
- Journal: Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press: 05 August 2019, pp. 1696-1697
- Print publication: August 2019
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