8 results
Strain Profiles in Si Channel of PMOS Devices Affected by Shallow-Trench Isolation Strain Relaxation In Embedded SiGe
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1924-1925
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- July 2010
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TEM Observation of Oxide Scale Formed on a Ti-Al-Zr Alloy Oxidized at 3600 C in an Alkaline Steam
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- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 1988-1989
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- August 2005
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Silicon Light Emissions from Boron Implant-Induced Extended Defects
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- Journal:
- MRS Online Proceedings Library Archive / Volume 864 / 2005
- Published online by Cambridge University Press:
- 01 February 2011, E6.4
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- 2005
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Novel Chain Stack Capacitor for 32Mb FeRAM and Beyond
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- Journal:
- MRS Online Proceedings Library Archive / Volume 748 / 2002
- Published online by Cambridge University Press:
- 11 February 2011, U1.1
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- 2002
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Electrodes and Barriers for Dram and Feram: Processing, Integration, and Fundamentals
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- Journal:
- MRS Online Proceedings Library Archive / Volume 655 / 2000
- Published online by Cambridge University Press:
- 21 March 2011, CC2.1.1
- Print publication:
- 2000
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Growth Temperature Dependence of Size Distribution of Selfassembled Inas Quantum Dots on Gaas(001): From Diffusion- to Strain-Limited Growth
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- Journal:
- MRS Online Proceedings Library Archive / Volume 583 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 63
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- 1999
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Testosterone, sex hormone-binding globulin, calculated free testosterone, and oestradiol in male vegans and omnivores
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- Journal:
- British Journal of Nutrition / Volume 64 / Issue 1 / July 1990
- Published online by Cambridge University Press:
- 09 March 2007, pp. 111-119
- Print publication:
- July 1990
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