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High-Quality Sample Preparation by Low kV FIB Thinning for Analytical TEM Measurements
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- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue 2 / April 2007
- Published online by Cambridge University Press:
- 01 March 2007, pp. 80-86
- Print publication:
- April 2007
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Advanced TEM Investigations on Ni-Ti Shape Memory Material: Strain and Concentration Gradients Surrounding Ni4Ti3 Precipitates
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- Journal:
- MRS Online Proceedings Library Archive / Volume 842 / 2004
- Published online by Cambridge University Press:
- 26 February 2011, S3.6
- Print publication:
- 2004
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- Article
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