9 results
Rapid Fourier Masked Domain Mapping to Reveal Head to Head Charged Domain Walls in Lead Titanate
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 974-975
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- August 2019
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Atomic-Scale Characterization of Ferro-Electric Domains in Lithium Niobate-revealing the Electronic Properties of Domain Walls
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 576-577
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- August 2019
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Utilizing an Open-Source Workflow for the Analysis of Atom Dynamics in Two-Dimensional Materials
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 136-137
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- August 2019
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VEELS Study of Boron and Nitrogen Doped Single Layer Graphene
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 743-744
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- August 2015
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Atom-by-Atom STEM Investigation of Defect Engineering in Graphene
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 1736-1737
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- August 2014
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Electronic Structure Modification of Boron and Nitrogen Ion-Implanted Graphene Fingerprinted by STEM-EELS
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 1734-1735
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- August 2014
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Probing defects and impurity-induced electronic structure changes in single and double-layer hexagonal boron nitride sheets with STEM-EELS
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 1526-1527
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- July 2012
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Metal-Graphene Interaction Studied via Atomic Resolution Scanning Transmission Electron Microscopy
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1504-1505
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- July 2011
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Bright Enough to See Atoms?
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- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1356-1357
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- August 2006
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