In this paper, the authors have reported the structural and photoluminescence (PL) studies of pure and nickel (Ni) doped zinc oxide (ZnO) nanoparticles synthesized by the solution combustion method. The structural, morphological and optical studies are carried out by powder x-ray diffraction (XRD), field emission-scanning electron microscopy (FE-SEM) and PL spectra, respectively. The XRD pattern indicates that the prepared particles are in hexagonal wurtzite structure with the average crystalline size is around 35-50nm. Room temperature PL shows the near band edge related emission and the results are related several intrinsic defects in the ZnO nanoparticles.

We discuss room temperature CW operation of AlGaAs/GaAs SQW lasers and GaAs MESFETs with good pinch-off characteristic on SiO2 -back coated Si. The all-MOCVD-grown,SQW laser on Si with thermal-cycle annealing, which has the EPD of 1.5 × 107 cm−2, has the threshold current as low as 55 mA (1.41 kA/cm2) under CW operation at room temperature. The pinch-off and the sidegating effect characteristics of GaAs MESFETs on Si have been improved by using SiO2-back coating of Si and higher growth temperature. The maximum transconductance of 160 mS/mm has been obtained for the MESFET with a 2.5 × 15 µm gate. The main origin of sidegating effect associates with the channel layer-undoped GaAs layer beneath it interface. The SiO2 -back coating is found effective to obtain a lower background electron concentration in undoped GaAs layer and to control doping of the active layer in GaAs/Si.

The stress and strain of GaAs on Si grown by using strained superlattice intermediate layers and a two-step growth method are characterized by the photoluminescence, X-ray diffraction and the curvature radius. The strain of GaAs grown using strained superlattice intermediate layers is smaller than that grown by the two-step growth method.

GaAs and GaAsP with the entire compositional range are grow on Si using an intermediate layer of GaAsP strained superlattices to relax the lattice mismatch. The orientation of the overgrown GaAs layer is found to be determined by the direction of the off-angle of the Si (100) surface. The grown layers are characterized by photoluminescence, x-ray diffraction, electro reflectance and DLTS. GaAs/GaAlAs double heterostructure lasers and GaAsP visible LED's are fabricated on Si substrates. The structural and electronic properties of the grown layers and the device performances are reported in this paper.