1 results
Local Lattice Parameter Determination of Strained Areas of Semiconductors Using CBED
-
- Journal:
- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 310-311
- Print publication:
- August 2004
-
- Article
- Export citation