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Chemical Bonding State Analysis with High Energy-resolution Carbon K-Emission Spectrum of Soft Materials Obtained by Soft X-ray Emission Spectrometer
Masaru Takakura, Takanori Murano, Shogo Koshiya, Peter McSwiggen, Vernon Robertson
Journal:

Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022

Published online by Cambridge University Press:

22 July 2022, pp. 1014-1015

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August 2022
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Time Resolved SEM-SXES Analysis for Lithium Material
Yasuaki Yamamoto, Takanori Murano, Hiroshi Onodera, Natasha Erdman, Reiko Matsuda, Atsunori Matsuda
Journal:

Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020

Published online by Cambridge University Press:

30 July 2020, pp. 68-70

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August 2020
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Characterization of Si Surface by SEM-SXES using Low Incident Voltage
Yasuaki Yamamoto, Hideyuki Takahashi, Takanori Murano, Naoki Kikuchi, Natasha Erdman
Journal:

Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018

Published online by Cambridge University Press:

01 August 2018, pp. 1062-1063

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August 2018
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Non-uniform Distribution of Doped Carrier in a Na-doped CaB6 Bulk Material Observed by EPMA-SXES
Masami Terauchi, Yohei Sato, Masatoshi Takeda, Tadashi Hatano, Masato Koike, Hiroyuki Sasai, Tetsuya Nagano, Masaru Koeda, Takanori Murano, Hideyuki Takahashi
Journal:

Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018

Published online by Cambridge University Press:

01 August 2018, pp. 746-747

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August 2018
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History of JEOL Microbeam Analysis: High Accuracy Analyses for Scientific and Industrial Work from the Centimeter to Nanometer Scale
Hideyuki Takahashi, Hiroyuki Yamada, Satoshi Notoya, Masaru Takakura, Takanori Murano, Vernon Robertson, Peter McSwiggen
Journal:

Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017

Published online by Cambridge University Press:

04 August 2017, pp. 1018-1019

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July 2017
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The Present State of Chemical State Analysis in EPMA and WD-SXES
Norihisa Mori, Takanori Murano, Hideyuki Takahashi
Journal:

Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014

Published online by Cambridge University Press:

27 August 2014, pp. 918-919

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August 2014
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Chemical State Information of Bulk Specimens Obtained by SEM-Based Soft-X-Ray Emission Spectrometry
Masami Terauchi, Shogo Koshiya, Futami Satoh, Hideyuki Takahashi, Nobuo Handa, Takanori Murano, Masato Koike, Takashi Imazono, Masaru Koeda, Tetsuya Nagano, Hiroyuki Sasai, Yuki Oue, Zeno Yonezawa, Satoshi Kuramoto
Journal:

Microscopy and Microanalysis / Volume 20 / Issue 3 / June 2014

Published online by Cambridge University Press:

14 March 2014, pp. 692-697

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June 2014
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Electron-beam-induced soft-X-ray emission spectroscopy (SXES) that uses a grating spectrometer has been introduced to a conventional scanning electron microscope (SEM) for characterizing desired specimen areas of bulk materials. The spectrometer was designed as a grazing incidence flat-field optics by using aberration corrected (varied line spacing) gratings and a multichannel plate detector combined with a charge-coupled device camera, which has already been applied to a transmission electron microscope. The best resolution was confirmed as 0.13 eV at Mg L-emission (50 eV), which is comparable with that of recent dedicated electron energy-loss spectroscopy instruments. This SXES-SEM instrument presents density of states of simple metals of bulk Mg and Li. Apparent band-structure effects have been observed in Si L-emission of Si wafer, P L-emission of GaP wafer, and Al L-emissions of intermetallic compounds of AlCo, AlPd, Al2Pt, and Al2Au.

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7 results

Chemical Bonding State Analysis with High Energy-resolution Carbon K-Emission Spectrum of Soft Materials Obtained by Soft X-ray Emission Spectrometer

Time Resolved SEM-SXES Analysis for Lithium Material

Characterization of Si Surface by SEM-SXES using Low Incident Voltage

Non-uniform Distribution of Doped Carrier in a Na-doped CaB6 Bulk Material Observed by EPMA-SXES

History of JEOL Microbeam Analysis: High Accuracy Analyses for Scientific and Industrial Work from the Centimeter to Nanometer Scale

The Present State of Chemical State Analysis in EPMA and WD-SXES

Chemical State Information of Bulk Specimens Obtained by SEM-Based Soft-X-Ray Emission Spectrometry

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7 results

Chemical Bonding State Analysis with High Energy-resolution Carbon K-Emission Spectrum of Soft Materials Obtained by Soft X-ray Emission Spectrometer

Time Resolved SEM-SXES Analysis for Lithium Material

Characterization of Si Surface by SEM-SXES using Low Incident Voltage

Non-uniform Distribution of Doped Carrier in a Na-doped CaB6 Bulk Material Observed by EPMA-SXES

History of JEOL Microbeam Analysis: High Accuracy Analyses for Scientific and Industrial Work from the Centimeter to Nanometer Scale

The Present State of Chemical State Analysis in EPMA and WD-SXES

Chemical State Information of Bulk Specimens Obtained by SEM-Based Soft-X-Ray Emission Spectrometry