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Strain Distribution Analysis during Tensile Deformation of Silicon Nanowire with 4D-STEM
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 1918-1920
- Print publication:
- August 2022
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- Article
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Automatic Diffraction Analysis and Lattice Fitting for Convergent-Beam Electron Diffraction Patterns in 4D-STEM
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- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 1280-1281
- Print publication:
- August 2021
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- Article
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- You have access
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