7 results
Composition of Carbon Clusters in Implanted Silicon Using Atom Probe Tomography
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue 4 / August 2022
- Published online by Cambridge University Press:
- 21 September 2021, pp. 994-997
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- August 2022
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Assessment of High Sn Incorporation in Ge NanoWires Synthesized via In Plane Solid-Liquid-Solid Mechanism by In-Situ TEM
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 306-307
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- August 2018
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New Atom Probe Tomography Reconstruction Algorithm for Multilayered Samples: Beyond the Hemispherical Constraint
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue 2 / April 2017
- Published online by Cambridge University Press:
- 22 March 2017, pp. 247-254
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- April 2017
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A Meshless Algorithm to Model Field Evaporation in Atom Probe Tomography
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue 6 / December 2015
- Published online by Cambridge University Press:
- 09 November 2015, pp. 1649-1656
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- December 2015
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Atom probe tomography in nanoelectronics
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- Journal:
- The European Physical Journal - Applied Physics / Volume 68 / Issue 1 / October 2014
- Published online by Cambridge University Press:
- 26 September 2014, 10101
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- October 2014
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Co-implantation : A simple way to grow doped Si nanocrystals embedded in SiO2
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1455 / 2012
- Published online by Cambridge University Press:
- 20 July 2012, mrss12-1455-ii08-21
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- 2012
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Influence of the Ge Dose in Ion-implanted SiO2 Layers on the Related Nanocrystal-memory Properties
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- Journal:
- MRS Online Proceedings Library Archive / Volume 933 / 2006
- Published online by Cambridge University Press:
- 01 February 2011, 0933-G02-05
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- 2006
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