6 results
Correlative t-EBSD Tomography and Atom Probe Tomography Analysis
-
- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 682-683
- Print publication:
- July 2016
-
- Article
-
- You have access
- Export citation
Characterization of Potential Artifacts in the Estimation of Local Plastic Strain near Grain Boundaries via EBSD
-
- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 722-723
- Print publication:
- July 2012
-
- Article
- Export citation
Chemistry Assisted Phase Differentiation in Automated Electron Backscatter Diffraction
-
- Journal:
- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 682-683
- Print publication:
- August 2002
-
- Article
-
- You have access
- Export citation
New Capabilities for the TEM: Automatic Orientation Measurement and Nanocrystal Grain Maps
-
- Journal:
- Microscopy Today / Volume 7 / Issue 6 / August 1999
- Published online by Cambridge University Press:
- 14 March 2018, pp. 12-15
- Print publication:
- August 1999
-
- Article
-
- You have access
- Export citation
Analysis of Multiphase Materials Using Electron Backscatter Diffraction
-
- Journal:
- Microscopy and Microanalysis / Volume 3 / Issue S2 / August 1997
- Published online by Cambridge University Press:
- 02 July 2020, pp. 561-562
- Print publication:
- August 1997
-
- Article
- Export citation
Influence of Tungsten Alloying Additions on the Mechanical Properties and Texture of Tantalum
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 322 / 1993
- Published online by Cambridge University Press:
- 25 February 2011, 407
- Print publication:
- 1993
-
- Article
- Export citation