43 results
HAADF-STEM Study of MBE-Grown Dirac Semimetal Cd3As2
- Journal: Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press: 04 August 2017, pp. 1480-1481
- Print publication: July 2017
-
- Article
-
- You have access
- Export citation
Quantification of Epitaxial Strain and Crystal Structure in Nanoscale Oxide Films Using Position Averaged Convergent Beam Electron Diffraction
- Journal: Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press: 09 October 2013, pp. 686-687
- Print publication: August 2013
-
- Article
-
- You have access
- Export citation
-
Quantifying Octahedral Rotations in Ultrathin LaNiO3 Films Using Position Averaged Convergent Beam Electron Diffraction
- Journal: Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press: 23 November 2012, pp. 1844-1845
- Print publication: July 2012
-
- Article
- Export citation
-
Determination of Thin-Film Ferroelectric Polarity at the Nanoscale
- Journal: Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press: 08 April 2017, pp. 1366-1367
- Print publication: July 2011
-
- Article
-
- You have access
- Export citation
-
Exploring the Strain Sensitivity of Image Contrast in Quantitative STEM of SrTiO3
- Journal: Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press: 08 April 2017, pp. 1310-1311
- Print publication: July 2011
-
- Article
-
- You have access
- Export citation
-
Effects of radiative heat transfer on the structure of turbulent supersonic channel flow
- Journal: Journal of Fluid Mechanics / Volume 677 / 25 June 2011
- Published online by Cambridge University Press: 15 April 2011, pp. 417-444
-
- Article
- Export citation
-
Towards Quantitative Analysis of STEM Image Contrast of Interfaces and Surfaces
- Journal: Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press: 01 August 2010, pp. 1472-1473
- Print publication: July 2010
-
- Article
-
- You have access
- Export citation
-
Position Averaged Convergent Beam Electron Diffraction
- Journal: Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press: 26 July 2009, pp. 494-495
- Print publication: July 2009
-
- Article
-
- You have access
- Export citation
-
Quantitative HAADF Imaging of Crystals Containing Heavy Elements: A Comparison with Theory
- Journal: Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press: 26 July 2009, pp. 466-467
- Print publication: July 2009
-
- Article
-
- You have access
- Export citation
-
Simulation of Atomic Resolution Images in STEM
- Journal: Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press: 03 August 2008, pp. 922-923
- Print publication: August 2008
-
- Article
- Export citation
-
Thermal Stability of Hf-Based Gate Dielectric Stacks with Rare-Earth Oxide Capping Layers
- Journal: Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press: 03 August 2008, pp. 418-419
- Print publication: August 2008
-
- Article
- Export citation
-
Quantitative HAADF-STEM and EELS
- Journal: Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press: 03 August 2008, pp. 1352-1353
- Print publication: August 2008
-
- Article
- Export citation
-
Combination of TEM and STEM to Investigate the Self-Assembly of Epitaxial Nanocomposites
- Journal: Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press: 05 August 2007, pp. 62-63
- Print publication: August 2007
-
- Article
- Export citation
-
The Electron Microscopy Database: A Resource for Teaching and Learning Quantitative Methods in Electron Microscopy and Spectroscopy
- Journal: Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press: 05 August 2007, pp. 1730-1731
- Print publication: August 2007
-
- Article
- Export citation
-
Impact of Sample Thickness on Atomic Resolution Tomography by HAADF-STEM
- Journal: Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press: 31 July 2006, pp. 1564-1565
- Print publication: August 2006
-
- Article
-
- You have access
- Export citation
-
Thickness Effects in High-angle Annular Dark-field Imaging of Interfaces
- Journal: Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press: 31 July 2006, pp. 1360-1361
- Print publication: August 2006
-
- Article
-
- You have access
- Export citation
-
Imaging of Hafnium Atoms and Clusters in Silicon Dioxide
- Journal: Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press: 31 July 2006, pp. 46-47
- Print publication: August 2006
-
- Article
- Export citation
-
Characterization of Bi1.5ZnNb1.5O7-x Pyrochlore Thin Films by High-angle Annular Dark-field Imaging in STEM
- Journal: Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press: 01 August 2005, pp. 1732-1733
- Print publication: August 2005
-
- Article
-
- You have access
- Export citation
-
Characterization of Epitaxial Semimetallic ErAs Particles in an In0.53Ga0.47As Matrix by High-Angle Annular Dark-Field Imaging
- Journal: Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press: 01 August 2005, pp. 1456-1457
- Print publication: August 2005
-
- Article
-
- You have access
- Export citation
-
HAADF Imaging and Low-Loss EELS Investigation of HfO2/TiN Interfaces in High-k Gate Stacks
- Journal: Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press: 01 August 2005, pp. 1446-1447
- Print publication: August 2005
-
- Article
-
- You have access
- Export citation
-