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Probing Sources of Decoherence at Defects and Interfaces in Superconducting Quantum Materials and Devices

Electron Counted STEM-EELS Spectroscopy Optimized for low kV (< 80 kV) via Hybrid Pixel Detection

Probing Optical Phenomena of Si@MoS2 Core-Shell Architectures at Nanoscale by Valence EELS

Controlled Growth of High-Index Faceted Nanoparticles Using the Gas Phase Environmental Cell TEM

In-situ Observation of the Degeneration Dynamics of Cu Nanowires under Carbon Dioxide Environment

The Performance of Detectors for Diffraction-Based Studies in (S)TEM.

Electron Beam Damage Mechanisms in Solution Phase Electron Microscopy of Metal-Organic Frameworks

Towards Spatial Mapping of Atomic Vibration Amplitudes in Thermoelectric Materials: Quantitative Convergent Beam Electron Diffraction (QCBED) Study of BiCuOQ (Q = S, Se, Te)

Characterization of Laundry Microplastics Through Automated Image Analysis

Dose-Efficient Defect Contrast with 4D-STEM

Multimodal and Correlative Characterization of Hybrid Structures: Application to Materials for Environmental Remediation

Exploring the inner space of outer space: multi-length scale, multimodal characterization of Muonionalusta IVA iron meteorite

Soft Microscopy of Negative Stained Soft Materials: Balancing Dose Rate and Sample Damage

To Cryo or Not to Cryo? A Consideration of Length Scales During Macromolecule Sample Preparation

Leveraging Hybrid Pixel Electron Detection Technology to Expand Electron Microscopy Observation of Material Structures at low Voltages

Structural and chemical analysis of mixed cation antiferromagnetic layered metal chalcophosphate FeCoP2S6

Towards Quantum Image Processing for Electron Microscopy

Si@MoS2 Core-Shell Architecture: Characterizations and Implications for Nanophotonic Applications

Spatial Mapping of Electrostatics and Dynamics in Quantum Materials

Phase Retrieval Imaging for Soft Materials at Low-Voltage

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