2 results
Augmenting the 3D Characterization Capability of the Dual Beam FIB-SEM
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- Journal:
- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 1136-1137
- Print publication:
- August 2004
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- Article
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Fabrication and Characterization of Micron-Sized Compression Samples using a Focused Ion Beam Microscope
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- Journal:
- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 1126-1127
- Print publication:
- August 2004
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- Article
- Export citation