10 results
Refinement of crystal structure using ‘digital’ large angle convergent beam electron diffraction
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- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 1282-1284
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- August 2021
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Measuring the Thickness of 2D Materials Using EDS
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 1212-1214
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- August 2020
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Improving the SNR of Atomic Resolution STEM EELS & EDX Mapping while Reducing Beam-damage by using Non-rigid Spectrum-image Averaging
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1215-1216
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- August 2015
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High Dynamic Range Electron Imaging: The New Standard
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue 5 / October 2014
- Published online by Cambridge University Press:
- 26 September 2014, pp. 1601-1604
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- October 2014
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Silicon Cross-Section Sample Preparation (Cleaving)
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- Journal:
- Microscopy Today / Volume 15 / Issue 4 / July 2007
- Published online by Cambridge University Press:
- 14 March 2018, p. 53
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- July 2007
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Quantitative Strain Mapping Applied to Aberration-Corrected HAADF Images
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- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue 4 / August 2006
- Published online by Cambridge University Press:
- 14 July 2006, pp. 285-294
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- August 2006
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Dislocation Dissociation in the Σ13 Grain Boundary in Silicon
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- Journal:
- MRS Online Proceedings Library Archive / Volume 238 / 1991
- Published online by Cambridge University Press:
- 25 February 2011, 151
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- 1991
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The Interactions Between Misfit Dislocations in InGaAs/GaAs Interfaces.
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- Journal:
- MRS Online Proceedings Library Archive / Volume 239 / 1991
- Published online by Cambridge University Press:
- 22 February 2011, 413
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- 1991
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Tilts in Thin Strained Layers.
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- Journal:
- MRS Online Proceedings Library Archive / Volume 238 / 1991
- Published online by Cambridge University Press:
- 25 February 2011, 17
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- 1991
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The Critical Thickness of Layers Subject to Anisotropic Misfit.
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- Journal:
- MRS Online Proceedings Library Archive / Volume 239 / 1991
- Published online by Cambridge University Press:
- 22 February 2011, 407
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- 1991
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