11 results
Hardware and Software Advances in Commercially Available Atom Probe Tomography Systems
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 40-41
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- July 2017
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Phase Composition at the Atomic-Size Scale through Multivariate Statistical Analysis of Atom Probe Tomography Data
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 720-721
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- July 2011
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Atomic-Scale Phase Composition through Multivariate Statistical Analysis of Atom Probe Tomography Data
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- Microscopy and Microanalysis / Volume 17 / Issue 3 / June 2011
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- 23 May 2011, pp. 418-430
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- June 2011
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Atomic Scale Compositional and Structural Characterization of Nanostructured Materials Using Combined FIB, STEM, and LEAP
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- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1720-1721
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- August 2006
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Three Dimensional Local Electrode Atom Probe Analysis of Microtips Fabricated on a Planar Specimen Utilizing a Broad Ion Beam
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- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 884-885
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- August 2005
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Pre-sharpened and Flat-top Microtip Coupons: a Quantitative Comparison for Atom-Probe Analysis Studies
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- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 882-883
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- August 2005
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Nanoscale Characterization of Magnetic Multilayers with Atom Probe Tomography
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- Journal:
- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 518-519
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- August 2004
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Site-Specific FIB Preparation of Atom Probe Samples
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- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 1150-1151
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- August 2004
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First Data from a Commercial Local Electrode Atom Probe (LEAP)
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- Microscopy and Microanalysis / Volume 10 / Issue 3 / June 2004
- Published online by Cambridge University Press:
- 01 June 2004, pp. 373-383
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- June 2004
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Configuration and Performance of a Local Electrode Atom Probe
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- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 21 July 2003, pp. 564-565
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- August 2003
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First Data from a Commercial Local Electrode Atom Probe
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- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 November 2002, pp. 1094-1095
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- August 2002
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