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High-resolution X-ray flash radiography of Ti characteristic lines with a multilayer Kirkpatrick–Baez microscope was developed on the Shenguang-II (SG-II) Update laser facility. The microscope uses an optimized multilayer design of Co/C and W/C stacks to obtain a high reflection efficiency of the Ti characteristic lines while meeting the precise alignment requirement at the Cu Kα line. The alignment method based on dual simulated balls was proposed herein, which simultaneously realizes an accurate indication of the center field of view and the backlighter position. The optical design, multilayer coatings, and alignment method of the microscope and the experimental result of Ti flash radiography of the Au-coned CH shell target on the SG-II Update are described.
In the era of knowledge networking, the structure and production mode of knowledge are constantly changing. This article creatively introduces the knowledge mapping method in design research, and based on the perspective of the National Natural Science Foundation of China (NSFC) to compile literature, uses word frequency analysis, co-word analysis, and citation analysis to construct knowledge graphs of design science. This study graphically shows the distribution and flow law of knowledge within design discipline and probes into the research frontier and evolution trend of Chinese design science.
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